X-ray reflectivity determination of interface roughness and correlated with magnetic coercivity of Co{sub}82Cr{sub}12Pt{sub}4Ta{sub}4 thin film

摘要

Previous study on Co alloy thin film media showed that underlayer could have a very important role in controlling the magnetic properties of whole media film. With the development from bcc Cr underlayer to B2 NiAl underlayer and success of various intermediate layer structure design, it suggested that interfacial factors should attracts more attentions. However, it lacks direct method to detect interfaces formed in this multilayer system. Mechanism obtained from surface studies could not be simply extended to apply for interfaces On the other hand, depth-profiling techniques often experienced bombardment shift for material composition and other structure parameters.