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FILM COMPOSITION AND UNDERLAYER EFFECTS ON OFF-TRACK ERROR-RATE PERFORMANCE IN CoCrPtTa MEDIA ON GLASS-CERAMIC SUBSTRATES

机译:薄膜组成和底层对玻璃 - 陶瓷基材上Cocrptta媒体的离轨差价效应

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In recent years, alternatives to NiP/Al substrates have been introduced and higher coercivity alloys have been employed to push recording density to higher levels [1,2]. The flatter alternative substrates, such as glass or glass-ceramic, allow the head to fly lower and Pt additions to CoCrTa alloys increase coercivity (Hc) to ensure a shorter recording transition length. To make full use of these advances, more information is needed on the quaternary alloy composition dependence of media noise behavior and off-track-error-rate performance, especially in the high recording density regime. Buffer/underlayer/CoCrPtTa/C film structures were DC magnetron sputter deposited onto 65 mm glass-ceramic substrates in a static sputtering system. The base pressure was typically 5×10~(-7) mTorr. The substrates were preheated to 200-300°C and the sputtering pressure was about 13 mTorr. Transmission electron microscope and atomic force microscope were used to examine the film grain microstructure and morphology. Magnetic properties were tested using a non-destructive rotating disc magnetometer. The recording characteristics and media noise were measured at a linear density of 125 kfci using a Guzik 1601 tester with a magnetoresistive (MR) head with a 0.35 μin gap length and flying at a nominal height of 2.1 μin. Off-track error-rate performance was obtained using a SAL-MR head flying also at nominal 2.1 μin with a speed of 13.9 m/sec utilizing a commercial PRML channel with 60.8 Mbps data rate [3,4]. The accompanying table summarizes magnetic properties, signal-to-media-noise ratio (SNR) and off-track capability (OTC) of the films prepared with different film compositions and choice of buffer and underlayers. Similar magnetic properties were obtained for all samples to minimize media noise and OTC variations directly due to different magnetic properties. Discs 1-6 are the films with Cr both as buffer and underlayer. A clear trend is observed in these samples; (1) higher Cr content leads to a significantly better SNR and OTC; (2) higher Ta content also leads to a better SNR and OTC but to a lesser extent; and (3) higher Pt content significantly degrades SNR and OTC. Discs 7 and 8, with CrV underlayer, are the two best noise performing films compared with the films with Cr underlayer, SNR was improved by 1.7 dB and OTC was improved by 12%. In disc 9, CrV was used for both the buffer layer and underlayer. An enhancement of 4.9 dB SNR and 23% OTC were the result. The figure plots OTC versus SNR for all alloys, indicating the strong correlation between OTC and the broad band noise. The choice of CrV as both buffer and underlayer for Co_(76)Cr_(15)Pt_(5)Ta_(4) film clearly exhibits the best performance.
机译:近年来,已经引入了NIP / Al基材的替代品,并且已经采用更高的矫顽力,将记录密度推向更高水平[1,2]。如玻璃或玻璃 - 陶瓷的更平坦的替代衬底允许头部飞行到Cocrta合金增加矫顽力(HC)以确保较短的记录过渡长度。为了充分利用这些进步,需要更多信息在媒体噪声行为和偏离轨道误差率性能的依赖性上,特别是在高记录密度方案中。缓冲器/底层/ Cocrptta / C膜结构是DC磁控溅射沉积在静态溅射系统中的65mm玻璃陶瓷基板上。基础压力通常为5×10〜(-7)mtorr。将底物预热至200-300℃,溅射压力为约13毫托。透射电子显微镜和原子力显微镜用于检查膜晶粒微观结构和形态学。使用非破坏性旋转盘磁力计测试磁性。使用具有0.35μIN间隙长度的Guzik 1601测试仪以125kFCI的线性密度以125kFCI的线密度测量记录特性和介质噪声,其具有0.35μIN间隙长度,并以2.1μIN的标称高度飞行。使用SAL-MR头飞行也在标称2.1μIN的标称2.1μIN的速度下获得截止轨道速率性能,速度为13.9米/秒,利用具有60.8 Mbps的数据速率[3,4]。随附的表总结了用不同膜组合物制备的薄膜的磁性,信号 - 媒体噪声比(SNR)和偏离轨道能力(OTC)和缓冲液和底层的选择。获得类似的磁性,用于所有样品,以最小化由于不同的磁性而直接地最小化介质噪声和OTC变化。光盘1-6是用Cr的薄膜作为缓冲和底层。在这些样本中观察到明确的趋势; (1)较高的Cr含量导致具有明显更好的SNR和OTC; (2)较高的TA含量也导致更好的SNR和OTC,但程度较小; (3)较高的Pt含量显着降解SNR和OTC。与CRV底层的光盘7和8是与CR底层薄膜相比的两个最佳噪声性膜,SNR得到1.7dB,OTC提高了12%。在盘9中,CRV用于缓冲层和底层。结果增强了4.9 dB SNR和23%OTC是结果。图形绘制了所有合金的OTC与SNR,表明OTC与宽带噪声之间的强相关性。 CRV选择CRV和CO_(76)CR_(15)PT_(5)TA_(4)薄膜的缓冲和底层显然表现出最佳性能。

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