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EVALUATION OF QFN TECHNOLOGY WITH OPTICALLY INSPECT ABLE SOLDER CONNECTIONS

机译:光学检查可焊连接的QFN技术评估

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QFN or Quad Flat No-Lead packages have steadily been gaining popularity since being first introduced and then registered as a JEDEC package almost twenty years ago [1]. This leadframe based, leadless package can offer many advantages over leaded (i.e., QFP, SOIC, TSSOP, etc..) and ball grid array (BGA) packages including lower overall mounted height, reduced footprint, excellent electrical and thermal performance and all at a cost typically lower than substrate-based and leaded packages of similar I/O [2]. Currently, QFN is typically limited to up to 12x12 mm body size and up to the low 100's in I/O depending on lead pitch for single row QFNs [3-4]. QFN originally exclusively incorporated gold and then copper wire-bond interconnects from die to leadframe, but has evolved to include flip chip on lead. Other developments in QFN configurations that have occurred in recent years include cavity QFN with a pre-molded cavity instead of conventional transfer molded, stacked die, multi row or array QFN, half etching of leadframes to increase interlocking and therefore package integrity, thermal enhancements, and pitch reductions from the original 1.0 mm pitch down to 0.4 and even 0.3 mm pitch. Most QFNs incorporate either NiPd/NiPdAu pre-plated leadframes (PPF) or matte Sn electroplating following the molding process. Another area of considerable development has been with the QFN package assembly process itself. QFNs have always been molded on a multi-up (matrix) leadframes. For QFNs where each individual unit has its own mold cavity, a punching process is typically used to singulate units from the leadframe. For QFNs where multiple units are molded in a single cavity, a saw process is used to singulate individual units. Both of these processes can result in leadframe bare copper on the exterior perimeter of the part being exposed. One of the perceived disadvantages of QFN had been the fact that on packages with this exposed copper, which generally gets oxidized prior to SMT reflow, it does not consistently wet with solder in typical SMT processes. Lack of a QFN side fillet results in only the joints under the package being inspectable by X-ray in a similar manner to BGA. However, BGA does not rely as much as QFN on a very consistent solder paste printing process since most of the volume of a BGA solder joint is supplied by the volume of BGA sphere. This paper will go over leadframe and package manufacturing processes that can be used to potentially make the portion of the leadframe that is exposed on the side of the package to be solderable. This can lead to consistent solder joint fillet formation on the side of the QFN package that is easily inspectable including with Automated Optical Inspection (AOI). The two most common ways to achieve at least a partially wettable lead on the sides of the QFN are the use of "dimpled" leadframes or by step-cutting the package so that part of the edge of the lead gets electroplated with Sn. QFNs that promote the formation of side fillets are referred to as QFNs with "inspectable joints" (IJ) or "wettable flanks" (WF). This paper will present a case study on step-cut QFNs that are able to form these optically inspectable joints. PCB footprint design, stencil design, SMT processes, inspection data along with reliability data will be discussed.
机译:自从大约20年前首次引入然后注册为JEDEC封装以来,QFN或Quad Flat No-Lead封装就一直稳步流行。这种基于引线框架的无铅封装可以提供优于含铅封装(即QFP,SOIC,TSSOP等)和球栅阵列(BGA)封装的许多优势,包括更低的总体安装高度,更小的占位面积,出色的电气和热性能以及所有优点。通常,其成本要低于类似I / O的基于衬底的引线封装[2]。目前,根据单排QFN的引线间距,QFN通常限于最大12x12 mm的机身尺寸和不超过100的I / O范围[3-4]。 QFN最初专门包含金,然后从管芯到引线框采用铜线键合互连,但现在已经发展为包括倒装芯片引线。近年来,QFN配置的其他发展包括具有预成型腔体的腔体QFN代替了传统的传递模制,堆叠式芯片,多行或阵列QFN;对引线框架进行了半蚀刻以增加互锁性,从而提高了封装的完整性;增强了散热性,并将间距从原来的1.0毫米间距减小到0.4甚至0.3毫米间距。大多数QFN都在模制工艺后结合了NiPd / NiPdAu预镀引线框架(PPF)或雾锡电镀。 QFN封装组装工艺本身就是另一个重要的发展领域。 QFN一直模制在多层(矩阵)引线框架上。对于每个单独的单元都有其自己的模腔的QFN,通常使用冲压工艺从引线框架中分离单元。对于在单个腔中模制多个单元的QFN,使用锯切工艺将单个单元分离。这两个过程都可能导致引线框架裸铜暴露在零件的外周边上。 QFN的一个已知缺点是,在带有裸露铜的封装上,通常在SMT回流之前会被氧化,在典型的SMT工艺中,铜并不会始终被焊料润湿。缺少QFN侧面圆角导致X射线只能以类似于BGA的方式检查封装下方的接缝。但是,由于BGA焊点的大部分体积是由BGA球体的体积提供的,因此BGA并不像QFN那样依赖非常一致的焊膏印刷工​​艺。本文将介绍引线框和封装的制造过程,这些过程可用于使引线框暴露在封装侧面的部分具有可焊接性。这会导致QFN封装侧面形成一致的焊点角,包括自动光学检查(AOI)在内,很容易检查。在QFN的侧面上获得至少部分可润湿的引线的两种最常见的方法是使用“凹陷”引线框,或者通过分步切割封装使引线边缘的一部分电镀锡。促进侧面圆角形成的QFN称为带有“检查接头”(IJ)或“可润湿侧翼”(WF)的QFN。本文将针对能够形成这些光学检查接头的阶梯式QFN进行案例研究。将讨论PCB足迹设计,模板设计,SMT工艺,检查数据以及可靠性数据。

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