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SEU Characterization of an Embedded 130nm Compiled SRAM in Heavy Ion and Proton Environments

机译:重离子和质子环境中嵌入式130nm编译SRAM的SEU表征

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Embedded Compiled SRAMs are included as part of the Cobham 130nm Radiation Hardened ASIC design environment. Previous testing of the Cobham 130nm library was performed at Lawrence Berkeley National Laboratory and is reported in the following references [1]-[4]. This work describes additional characterization of two architectures of compiled embedded SRAMs in heavy ion and proton environments. Heavy ion testing was performed at the Texas A&M University Cyclotron Institute (TAMU) and proton testing was performed at the TRI-University Meson Facility (TRIUMF).
机译:嵌入式编译的SRAM包含在Cobham 130nm辐射强化ASIC设计环境中。 Cobham 130nm库的先前测试是在劳伦斯·伯克利国家实验室进行的,并在以下参考文献中报道[1]-[4]。这项工作描述了重离子和质子环境中编译嵌入式SRAM的两种体系结构的其他特性。重离子测试是在德克萨斯农工大学回旋加速器研究所(TAMU)进行的,质子测试是在TRI大学的介子工厂(TRIUMF)进行的。

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