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TID, ELDRS and SEE Hardening and Testing on Mixed Signal Telemetry LX7730 Controller

机译：混合信号遥测LX7730控制器的TID，ELDRS和SEE强化和测试

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摘要

TID, ELDRS and SEE hardening and testing of the first radiation hardened analog mixed-signal telemetry controller IC, the LX7730, are presented.

机译：提出了TID，ELDR，以及第一辐射硬化模拟混合信号遥测控制器IC，LX7730的硬化和测试。

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《IEEE Radiation Effects Data Workshop》|2017年|1-8|共8页
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Mathieu Sureau; Russell Stevens; Marco Leuenberger; Nadia Rezzak; Dorian Johnson;
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Testing; Telemetry; Performance evaluation; Radiation hardening (electronics); Single event upsets; Field programmable gate arrays; Flip-flops;

机译：测试;遥测;性能评估;辐射硬化（电子）;单事件不安定;现场可编程门阵列;触发器;
入库时间 2022-08-26 15:03:00

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机译：混合信号遥测LX7730控制器的扩展TID，ELDRS和SEE强化和测试
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TID, ELDRS and SEE Hardening and Testing on Mixed Signal Telemetry LX7730 Controller

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