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Asymmetric S/D contacts with BN tunneling barrier on black phosphorous FETs

机译:黑色磷FET上具有BN隧道势垒的非对称S / D触点

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摘要

This paper reveals the significance of contact tunneling barrier for narrow bandgap black phosphorus (BP) PMOSFETs. Without the tunneling barrier, record high I of 940μA/μm is achieved however I is also increased due to the reverse electron tunneling current. With an asymmetric BN tunneling barrier at source side, I is reduced by a factor of 5×10 at a cost of 20% I reduction.
机译:本文揭示了接触隧穿势垒对于窄带隙黑磷(BP)PMOSFET的重要性。没有隧穿势垒,达到了创纪录的940μA/μm的高I,但是由于反向电子隧穿电流,I也增加了。在源侧使用不对称的BN隧穿势垒,将I降低5×10倍,而I降低20%。

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