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A Q-Band/W-Band Dual-Band Power Amplifier in 0.12 μm SiGe BiCMOS Process

机译:Q频段/ W频段双频功率功放,0.12μmSiGeBICMOS工艺

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Abstract-- A three-stage dual-band power amplifier is demonstrated in 0.12 um silicon germanium (SiGe) BiCMOS process at both Q-band and W-band. The first two stages are pseudo-differential pre-amplifiers with a high-impedance dual-band load. The final stage is a single-ended power amplifier with an appropriate impedance to produce output power. The collector-emitter junction breakdown voltage of the amplifier is extended with a low-impedance base current biasing network. The amplifier achieves a peak power-added efficiency (PAE) of 15% with 14 dBm maximum saturated power (Psat) at 43 GHz and 9 dBm Psat at 82 GHz. The effective chip area is 1mm^2 including input and output RF GSG pads.
机译:摘要 - 在Q波段和W波段的0.12 UM硅锗(SiGe)BICMOS工艺中展示了一个三级双频功率放大器。前两个阶段是具有高阻抗双带负载的伪差分预放大器。最终阶段是单端功率放大器,具有适当的阻抗以产生输出功率。放大器的集电极 - 发射极结击击穿电压与低阻抗基极电流偏置网络延伸。放大器在82GHz的43 GHz和9 dBm PSAT中实现了15%的峰值电力增加效率(PAE),为14dBm最大饱和功率(PSAT)和9 dBm psat。有效芯片区域为1mm ^ 2,包括输入和输出RF GSG焊盘。

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