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A Q-Band/W-Band Dual-Band Power Amplifier in 0.12 µm SiGe BiCMOS Process

机译:采用0.12 µm SiGe BiCMOS工艺的Q波段/ W波段双波段功率放大器

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Abstract-- A three-stage dual-band power amplifier is demonstrated in 0.12 um silicon germanium (SiGe) BiCMOS process at both Q-band and W-band. The first two stages are pseudo-differential pre-amplifiers with a high-impedance dual-band load. The final stage is a single-ended power amplifier with an appropriate impedance to produce output power. The collector-emitter junction breakdown voltage of the amplifier is extended with a low-impedance base current biasing network. The amplifier achieves a peak power-added efficiency (PAE) of 15% with 14 dBm maximum saturated power (Psat) at 43 GHz and 9 dBm Psat at 82 GHz. The effective chip area is 1mm^2 including input and output RF GSG pads.
机译:摘要-在Q波段和W波段均采用0.12 um硅锗(SiGe)BiCMOS工艺演示了三级双波段功率放大器。前两个阶段是具有高阻抗双频带负载的伪差分前置放大器。最后一步是具有适当阻抗的单端功率放大器,以产生输出功率。放大器的集电极-发射极结击穿电压通过低阻抗基极电流偏置网络得到扩展。该放大器在43 GHz时具有14 dBm的最大饱和功率(Psat),在82 GHz时具有9 dBm Psat的峰值功率附加效率(PAE)达到15%。包括输入和输出RF GSG焊盘的有效芯片面积为1mm ^ 2。

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