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A STUDY ON PROCESS, STRENGTH AND MICROSTRUCTURE ANALYSIS OF LOW TEMPERATURE SnBi CONTAINING SOLDER PASTES MIXED WITH LEAD-FREE SOLDER BALLS

机译:含无铅锡球的低温含锡铋锡膏的工艺,强度和微观结构分析的研究

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As the traditional eutectic SnPb solder alloy has been outlawed, the electronic industry has almost completely transitioned to the lead-free solder alloys [1] [2]. The conventional SAC305 solder alloy used in lead-free electronic assembly has a high melting and processing temperature with a typical peak reflow temperature of 245°C which is almost 30°C higher than traditional eutectic SnPb reflow profile. Some of the drawbacks of this high melting and processing temperatures are yield loss due to component warpage which has an impact on solder joint formation like bridging, open defects, head on pillow [3], and other drawbacks which include circuit board degradation, economic and environmental factors [4], and brittle failure defects in the circuit board like pad cratering. To overcome this, a detailed study has been carried out on low temperature lead-free solder paste that utilizes Bi bearing alloys. Three low temperature lead-free solder pastes Sn-58Bi, Sn-57Bi-1Ag and Sn-40Bi-Cu-Ni with the melting temperatures around 138°C (which is 45°C below eutectic SnPb and 79°C below SAC) were printed on Cu-OSP finish test boards. These pastes were assembled with SAC305, Sn99CN and Sn100C solder spheres. The range of Bi concentrations for various resulting mixtures used in this study was calculated to be in the range of 2 to 4 wt%. The mixtures were reflowed under two different low temperatures reflow profiles; (a) a traditional SnPb profile with a peak temperature 217°C and (b) a low temperature SnBi profile with a peak temperature 177°C (recommended by the paste manufacturer). After the assembly process, the mixed solder joints were shear tested to study the failure modes and shear strength at rate of 27.50mils/sec. Cross sectioning was performed to evaluate the possible microstructural changes at room temperature and after aging conditions that may have led to the changes in failure mode observed in shear testing. The isothermal aging condition used in the study is 125°C for 200 hours which mimics 21 years of field storage at 25°C degrees using Arrhenius extrapolation for Cu_6Sn_5; intermetallic formation. Our study suggests that high temperature reflow profile (217°C peak profile) had better mechanical strength than the low temperature reflow profile (177°C peak profile). A metallurgical explanation for the improvement is presented in this paper. Thus, this paper describes that by generating a robust reflow assembly process for SnBi solder paste, the shear strength can be increased, cost of manufacturing can be reduced and high temperature assembly process (SAC) issues can be minimized which may improve product yield in production.
机译:由于传统的共晶SnPb焊料合金已被取缔,因此电子工业几乎完全过渡到了无铅焊料合金[1] [2]。用于无铅电子组件的常规SAC305焊料合金具有较高的熔化和加工温度,典型的峰值回流温度为245°C,比传统的共晶SnPb回流曲线高出近30°C。这种高熔点和加工温度的缺点是由于部件翘曲而导致的良率损失,这会影响焊接点的形成,例如桥接,开路缺陷,枕头[3],以及其他缺点,包括电路板的退化,经济性和可靠性。环境因素[4]以及电路板上的脆性破坏缺陷(如焊盘缩孔)。为了克服这个问题,已经对利用Bi轴承合金的低温无铅焊膏进行了详细的研究。三种低温无铅锡膏Sn-58Bi,Sn-57Bi-1Ag和Sn-40Bi-Cu-Ni的熔化温度约为138°C(比共晶SnPb低45°C,比SAC低79°C)。印刷在Cu-OSP完工测试板上。这些焊膏与SAC305,Sn99CN和Sn100C焊球组装在一起。本研究中使用的各种所得混合物的Bi浓度范围经计算为2至4 wt%。将混合物在两种不同的低温回流曲线下进行回流。 (a)峰值温度为217°C的传统SnPb轮廓和(b)峰值温度为177°C的低温SnBib轮廓(焊膏制造商推荐)。组装后,对混合焊点进行剪切测试,以27.50mils / sec的速率研究破坏模式和剪切强度。进行横截面以评估在室温和老化条件下可能导致剪切测试中观察到的破坏模式变化的可能的微观结构变化。研究中使用的等温老化条件是在125°C下持续200小时,这使用Cu_6Sn_5的Arrhenius外推法模拟了在25°C下21年的现场存储。金属间形成。我们的研究表明,高温回流曲线(217°C峰值曲线)比低温回流曲线(177°C峰值曲线)具有更好的机械强度。本文提出了改进的冶金学解释。因此,本文描述了通过为SnBi焊膏生成可靠的回流装配工艺,可以提高剪切强度,降低制造成本,并可以最大程度地减少高温装配工艺(SAC)问题,从而可以提高生产中的产品良率。 。

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