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Experimental Study of Sub DSA resolution Assist Features (SDRAF)

机译:子DSA分辨率辅助功能(SDRAF)的实验研究

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Cylindrical directed self-assembly (DSA) nanostructures is a promising candidate for patterning the contacts and vias in integrated circuits. To match the contact patterns in an IC layout, physical guiding templates have been adopted to generate aperiodic DSA patterns, and templates of different sizes could lead to various DSA patterns. It is found in the experiment that the density of guiding templates has a strong influence on the DSA patterns. At a low template density, templates tend to become overfilled and result in DSA defects. In this paper, we experimentally demonstrate an effective solution to counteract the influence of template pattern density on the quality of DSA using sub-DSA-resolution Assist Features (SDRAFs). We show that SDRAFs can reduce the DSA defects significantly.
机译:圆柱定向的自组装(DSA)纳米结构是用于图案化集成电路中的触点和通孔的有希望的候选者。为了匹配IC布局中的接触模式,已经采用了物理指导模板来产生非周期性DSA模式,不同大小的模板可能导致各种DSA模式。在实验中发现了指导模板的密度对DSA模式产生了强烈影响。在低模板密度下,模板往往会过满并导致DSA缺陷。在本文中,我们通过子DSA分辨率辅助特征(SDRAF)来实验地证明了一种有效的解决方案来抵消模板模式密度对DSA质量的影响。我们表明SDRAF可以显着降低DSA缺陷。

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