Comparative analysis of low dose-rate, accelerated, and standard cobalt-60 radiation response data for a low-dropout voltage regulator and a voltage reference

摘要

This paper presents the results of Cobalt-60 response measurements made on a low dropout voltage regulator and a shunt reference for three different radiation test conditions: low dose rate, accelerated (elevated temperature irradiation) and standard (50-300 rad(SiO{sub}2)/s). The accelerated test is shown to correlate well with the low dose rate failure of the reference but not for the failure of the regulator.