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Design of a reference voltage buffer for a 10-bit 50 MS/s SAR ADC in 65 nm CMOS

机译:用于65 nm CMOS的10位50 MS / s SAR ADC的参考电压缓冲器的设计

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This paper presents the design of a fast-settling reference voltage buffer (RVBuffer) which is used to buffer the high reference voltage in a 10-bit, 50 MS/s successive approximation register (SAR) ADC implemented in 65 nm CMOS. Though numerous publications on SAR ADCs have appeared in recent years, the role of RVBuffers in ensuring ADC performance, the associated design challenges and impact on power and FoM of the entire ADC have not been discussed in-depth. In this work, the speed limitation on precise settling of the digital-to-analog converter voltage (DAC) in a SAR ADC imposed by parasitic inductances of the bondwire and PCB trace is explained. The crucial design parameters for the reference voltage buffer in the context of the SAR ADC are derived. Post-layout simulation results for the RVBuffer are provided to verify settling-time, noise and PSRR performance. In post-layout simulation which includes the entire pad frame and associated parasitics, the SAR ADC achieves an ENOB of 9.25 bits at a supply voltage of 1.2 V, typical process corner and sampling frequency of 50 MS/s for near-Nyquist input. Excluding the reference voltage buffer, the ADC consumes 697 μW and achieves an energy efficiency of 25 fJ/conversion-step while occupying a core area of 0.055 mm.
机译:本文介绍了一种快速稳定的参考电压缓冲器(RVBuffer)的设计,该缓冲器用于在65 nm CMOS中实现的10位,50 MS / s逐次逼近寄存器(SAR)ADC中缓冲高参考电压。尽管近年来出现了大量有关SAR ADC的出版物,但尚未深入讨论RVBuffers在确保ADC性能,相关设计挑战以及对整个ADC的功耗和FoM的影响方面的作用。在这项工作中,解释了由键合线和PCB走线的寄生电感对SAR ADC中的数模转换器电压(DAC)进行精确稳定的速度限制。得出了SAR ADC情况下参考电压缓冲器的关键设计参数。提供RVBuffer的布局后仿真结果,以验证建立时间,噪声和PSRR性能。在包括整个焊盘框架和相关寄生因素的布局后仿真中,SAR ADC在1.2 V的电源电压,典型的工艺拐角和接近Nyquist输入的采样频率为50 MS / s的情况下实现了9.25位的ENOB。除基准电压缓冲器外,ADC消耗697μW的能量,转换效率为25 fJ /转换步长,而核心面积仅为0.055 mm。

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