首页> 外文会议>China Semiconductor Technology International Conference >An optimized and unified system for FPGA power-up validation to minimize post-silicon cycling time
【24h】

An optimized and unified system for FPGA power-up validation to minimize post-silicon cycling time

机译:优化和统一的系统,用于FPGA上电验证,以最大程度地减少硅后循环时间

获取原文

摘要

Power-up validation is a critical process in R&D of FPGA, since it will determine if a FPGA can work correctly at the very first step of operation. Power-up validation includes 4 separate blocks. Testing each block one by one couldn't meet today's short time-to market requirement for a new product. In this paper, an optimized and unified system is proposed to perform validation for all power-up items. The validation efficiency was improved by several times comparing to the traditional approach. The experimental results indicate nearly 90% test time can be saved for the power-up validation.
机译:上电验证是FPGA研发中的关键过程,因为它将在运行的第一步确定FPGA是否可以正常工作。上电验证包括4个独立的模块。逐个测试每个模块无法满足当今新产品上市时间短的要求。在本文中,提出了一种优化的统一系统来对所有加电项目进行验证。与传统方法相比,验证效率提高了数倍。实验结果表明,上电验证可以节省近90%的测试时间。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号