首页> 外文会议>ASME international mechanical engineering congress and exposition >Growth and characterization of titanium nitride nanowires on silicon substrate using pulsed laser deposition method for biological applications
【24h】

Growth and characterization of titanium nitride nanowires on silicon substrate using pulsed laser deposition method for biological applications

机译:脉冲激光沉积法在硅衬底上生长氮化钛纳米线及其表征

获取原文

摘要

The present work reports on the growth and characterization of titanium nitride (TiN) nanowires on silicon substrate using a pulsed laser deposition (PLD) method. The TiN nanowires were grown on single crystal silicon substrate with (100) and (111) orientations at a range of substrate temperatures and under both nitrogen ambient and vacuum. The different orientation of silicon was chosen to see the effect of the substrate orientation on the growth of TiN nanowires. The laser energy entering the vacuum chamber to impinge the TiN target for nanowire deposition was varied from 70 to 80 mJ. The TiN nanowires samples were characterized using Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD). The diameter of the nanowires was observed to increase from 25 nm to 40 nm with an increase in laser beam energy entering the chamber. The shape and orientation of the nanowires was observed to be the same for (100) and (111) oriented silicon substrates as observed in SEM images. Corrosion tests were also conducted on the TiN nanowires.
机译:本工作报告了使用脉冲激光沉积(PLD)方法在硅衬底上氮化钛(TiN)纳米线的生长和表征。 TiN纳米线在一定范围的衬底温度下以及在氮气环境和真空下以(100)和(111)取向生长在单晶硅衬底上。选择不同的硅取向以观察衬底取向对TiN纳米线生长的影响。进入真空室以撞击TiN靶进行纳米线沉积的激光能量在70到80 mJ之间变化。使用扫描电子显微镜(SEM)和X射线衍射(XRD)对TiN纳米线样品进行表征。随着进入腔室的激光束能量的增加,观察到纳米线的直径从25 nm增加到40 nm。对于在(100)和(111)取向的硅衬底上观察到的纳米线的形状和取向与在SEM图像中观察到的相同。还对TiN纳米线进行了腐蚀测试。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号