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Growth and characterization of titanium nitride nanowires on silicon substrate using pulsed laser deposition method for biological applications

机译:用脉冲激光沉积法在生物应用中使用脉冲激光沉积法的氮化钛纳米线的生长和表征

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The present work reports on the growth and characterization of titanium nitride (TiN) nanowires on silicon substrate using a pulsed laser deposition (PLD) method. The TiN nanowires were grown on single crystal silicon substrate with (100) and (111) orientations at a range of substrate temperatures and under both nitrogen ambient and vacuum. The different orientation of silicon was chosen to see the effect of the substrate orientation on the growth of TiN nanowires. The laser energy entering the vacuum chamber to impinge the TiN target for nanowire deposition was varied from 70 to 80 mJ. The TiN nanowires samples were characterized using Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD). The diameter of the nanowires was observed to increase from 25 nm to 40 nm with an increase in laser beam energy entering the chamber. The shape and orientation of the nanowires was observed to be the same for (100) and (111) oriented silicon substrates as observed in SEM images. Corrosion tests were also conducted on the TiN nanowires.
机译:目前的工作报告了使用脉冲激光沉积(PLD)方法的硅衬底上氮化钛(TiN)纳米线的生长和表征。在衬底温度范围内的(100)和(111)取向和氮环境下,在单晶硅衬底上生长锡纳米线和(111)取向。选择硅的不同取向,以便看到基材取向对锡纳米线的生长的影响。进入真空室的激光能量将用于纳米线沉积的锡靶的激光能量变化在70至80mJ中。使用扫描电子显微镜(SEM)和X射线衍射(XRD)表征锡纳米线样品。观察到纳米线的直径从25nm到40nm增加,随着进入腔室的激光束能量而增加。纳米线的形状和取向被观察到在SEM图像中观察到的(100)和(111)取向的硅基衬底是相同的。还在锡纳米线上进行腐蚀试验。

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