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Novel implantation process of carbon nanotubes for plugs and vias, and their integration with transferred multilayer graphene wires

机译:用于塞子和通孔的碳纳米管的新型注入工艺及其与转移的多层石墨烯线的集成

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We have developed a novel process, the implantation of carbon nanotubes (CNTs) into holes like plugs, vias, and through-silicon vias (TSVs) for the first time. The developed low-temperature process is suitable for back-end-of-line (BEOL) processes of LSI. With this approach, we can use high-quality CNTs grown at high temperature on a different substrate and densify CNTs. Consequently, the implanted CNT plugs had a resistance one order of magnitude lower than the directly grown CNT plugs. In addition, we successfully integrated the implanted CNT plug with transferred multilayer graphene (MLG) wires for all carbon interconnects.
机译:我们已经开发出一种新颖的工艺,首次将碳纳米管(CNT)注入到塞子,通孔和硅通孔(TSV)等孔中。开发的低温工艺适用于LSI的后端(BEOL)工艺。通过这种方法,我们可以使用在高温下在不同基板上生长的高质量CNT,并将CNT致密化。因此,所植入的CNT栓塞的电阻比直接生长的CNT栓塞低一个数量级。此外,我们成功地将植入的CNT塞与转移的多层石墨烯(MLG)线集成在一起,用于所有碳互连。

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