首页> 外文会议>IEEE East-West Design Test Symposium >Models for embedded repairing logic blocks
【24h】

Models for embedded repairing logic blocks

机译:嵌入式修复逻辑模块的模型

获取原文

摘要

The models of combinational circuits, focused on solving practical problems of embedded repairing components of the logic units are proposed. The logical circuit is complemented by operational and control automata for modeling digital devices, which increases processing time and hardware costs for creating a wrap of addressable elements. The structures can also be used for hardware modeling functionalities of digital projects by using PLD, which allows improving the performance of software model verification. The proposed solution of embedded gate repair for combinational circuits makes it possible to comprehensively solve the problem of autonomous repairing digital systems on chips due to the time and hardware project redundancy [1–12].
机译:提出了组合电路模型,重点解决了逻辑单元嵌入式修复元件的实际问题。逻辑电路由用于对数字设备进行建模的操作和控制自动机进行了补充,这增加了创建可寻址元素的处理时间和硬件成本。通过使用PLD,这些结构还可以用于数字项目的硬件建模功能,从而可以提高软件模型验证的性能。提出的用于组合电路的嵌入式门修复的解决方案可以全面解决由于时间和硬件项目冗余而导致的芯片上数字系统的自主修复问题[1-12]。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号