Electronics design has been driven by three major trends in recent years: going green, health & safety and connected intelligence. These three trends converge for automotive electronics design, driving the need for energy-efficient, intelligent and reliable chip products. This increases design complexity and demands for higher-quality products. Historically, test of automotive chip products has been a critical part to ensure that the quality demand is met. The recent trends present greater ever challenges for test of automotive chip products, including managing the enormous test data, dealing with new defect mechanisms, controlling the test cost while achieving the customer demand of zero defect rate. This talk discusses these challenges and two potential directions to overcome the challenges: Built-in Self Test (BIST) and data mining driven intelligent test. We will explain why BIST and test data mining are crucial for automotive electronics and how test is value-added for automotive chip products and not cost.
展开▼
