AN INVESTIGATION OF THE PHOTOLUMINESCENCE AND TRANSMITTANCE OF CdS_(1-x)Te_x THIN FILMS

摘要

CdS_(1-x)Te_x thin films were prepared by first producing CdS:In thin films by the spray pyrolysis (SP) technique and then annealing the films in the presence of Te vapor in nitrogen atmosphere. X-Ray diffraction (XRD) measurements showed that the films are polycrystalline with the wurtzite structure. Transmittance measurements were recorded at room temperature in the wavelength range 400-900 run and used to deduce the absorbance. The first derivative of the absorbance was calculated and used to find the values of the bandgap energy, where more than one bandgap was obtained for each film. These results show that the films are inhomogeneous or the composition differs with location. The photoluminescence (PL) was recorded at T = 60 K and a deconvolution peak fit was performed for each spectrum. The results of the PL spectra are consistent with those obtained from the first derivative and confirm the inhomogeneity of the films.