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The Simulation and Measurement of Scattering Property and Emissivity of the Microwave Radiometer Calibrator

机译:微波辐射计校准器的散射特性和发射率的仿真和测量

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The accuracy of measurement of calibrator emissivity is necessary for calibration of microwave radiometer. In this paper, the optimization of calibration source is presented, and the method of bistatic measurement system was chosen to measure the emissivity of calibration source, which is periodic cone array. The scattering property is measured and the emissivity of the calibrator is evaluated using bistatic measurement. The measurement is used to analyze scattering field of the calibrator as well as obtain the emissivity by integrating the differential scattering coefficient of the backscattered field.
机译:校准微波辐射计需要校准器发射率的测量精度。本文提出了标定源的优化方法,选择了双基地测量系统的方法来测量标定源的发射率,即周期锥阵列。测量散射特性,并使用双基地测量评估校准器的发射率。该测量用于分析校准器的散射场,并通过积分反向散射场的微分散射系数来获得发射率。

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