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The Simulation and Measurement of Scattering Property and Emissivity of the Microwave Radiometer Calibrator

机译:微波辐射计校准器散射性能和发射率的仿真与测量

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The accuracy of measurement of calibrator emissivity is necessary for calibration of microwave radiometer. In this paper, the optimization of calibration source is presented, and the method of bistatic measurement system was chosen to measure the emissivity of calibration source, which is periodic cone array. The scattering property is measured and the emissivity of the calibrator is evaluated using bistatic measurement. The measurement is used to analyze scattering field of the calibrator as well as obtain the emissivity by integrating the differential scattering coefficient of the backscattered field.
机译:微波辐射计的校准是必要的校准器发射率测量的准确性。在本文中,提出了校准源的优化,并选择了对双晶测量系统的方法测量校准源的发射率,这是周期性锥形阵列。测量散射性能,并使用双孔测量评估校准器的发射率。测量用于分析校准器的散射场,并通过积分背散射场的差分散射系数来获得发射率。

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