A Summary of Single Event Upset Testing of CD4000 Series Devices

机译：CD4000系列设备的单事件翻转测试摘要

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The results of single event upset (SEU) testing show that HCC4011, HCC4013, and HCC4066 devices are susceptible to transients only, HCC4020B is susceptible to bit upsets, and HCC4041 is immune to single event effects (SEE).

机译：单事件翻转（SEU）测试的结果表明，HCC4011，HCC4013和HCC4066器件仅易受瞬变的影响，HCC4020B易受比特翻转的影响，而HCC4041对单事件影响（SEE）免疫。

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《2011 IEEE Radiation Effects Data Workshop》|2011年|p.1-4|共4页
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Lombardi Robert E.; Bogorad Alexander L.; Likar Justin J.; Rubin Aaron S.; Camacho Carlos F.;
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4. A Summary of Single Event Upset Testing of CD4000 Series Devices [C] . Lombardi Robert E., Bogorad Alexander L., Likar Justin J., IEEE Radiation Effects Data Workshop . 2011

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A Summary of Single Event Upset Testing of CD4000 Series Devices

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