Reduction of testing power with pulsed scan flip-flop for scan based testing

摘要

In this paper, a new scan flip-flop is proposed for low power testing. Different flip-flops (Master-slave, hybrid, pulse triggered) are reviewed and evaluated their performance using ELDO simulator with TSMC 180 nm CMOS technology. Based on this evaluation, pulsed triggered flip-flop is selected as scan flip-flop because of lower transition power. Comparison of proposed scan flip-flop with existing mux based master-slave scan flip-flop is performed at the layout level. Experimental results on ISCAS89 benchmark circuit show that the proposed scan flip-flop can be used to reduce the test power.