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Copper ECMP in phosphoric acid-BTA slurries

机译:磷酸BTA浆料中的铜ECMP

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摘要

Copper ECMP bench test was conducted for copper in 30 wt% H3PO4+0.01M BTA slurry on a three-electrode tribo-electrochemical system. Electrochemical and tribological performance of copper in the slurry are studied. The inhibition effect of BTA is shown by material removal rate (MRR) and after-ECMP topographies of copper at different anodic potentials are analyzed by AFM. Results show that the applied anodic potential should be low enough to prevent corrosive pitting.
机译:在三电极摩擦电化学系统上对30wt%H 3 PO + 0.01M BTA浆液进行铜ECMP台面试验。研究了浆料中铜的电化学和摩擦学性能。通过AFM分析了BTA的抑制作用通过材料去除速率(MRR)和ECMP铜的后果覆盖后的铜地形。结果表明,施加的阳极电位应足够低,以防止腐蚀性点。

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