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Characterisation of apodized diffractive optical elements by means of Fresnel images measurement method

机译:菲涅耳图像测量方法表征变迹衍射光学元件

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摘要

In this paper the method for estimating the quality of apodization profile in the phase mask with variable diffraction efficiency is shown. The technique relies on Fresnel images contrast measurement, which allows determining the phase step heights of the apodized mask. The limitation of this approach is indicated and the method of its overcoming is proposed.
机译:本文提出了一种在衍射效率可变的情况下估计相位掩模中切趾轮廓质量的方法。该技术依靠菲涅耳图像对比度测量,该测量可以确定变迹掩模的相位步长。指出了这种方法的局限性,并提出了克服方法。

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