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Characterisation of apodized diffractive optical elements by means of Fresnel images measurement method

机译:通过菲涅耳图像测量方法表征减少衍射光学元件

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摘要

In this paper the method for estimating the quality of apodization profile in the phase mask with variable diffraction efficiency is shown. The technique relies on Fresnel images contrast measurement, which allows determining the phase step heights of the apodized mask. The limitation of this approach is indicated and the method of its overcoming is proposed.
机译:在本文中,示出了具有可变衍射效率的相位掩模中的沉积曲线质量的方法。该技术依赖于菲涅耳图像对比度测量,这允许确定叠加掩模的相位步高度。指出了这种方法的限制,提出了其克服的方法。

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