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Infrared-Light Interference System Based on Linnik-Type Interferometric Microscope for Three-Dimension Profile Measurement

机译:基于Linnik型干涉显微镜的红外干涉测量系统的三维轮廓测量

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Infrared-light interference system for three-dimension profile measurement is proposed in this paper. The measurement system comprises infrared-light halogen source, linnik-type interferometric microscope, infrared-light InGaAs CCD array camera and ceramic piezo. With transmission to GaAs wafer, measured three-dimension profile and steps heights of microstructure are highly consistent with the results obtained from famous commercial instrument MSA 400 via Stoilov phase-stepping algorithm. The system has widely potential applications in the field of MEMS, such as reconstructing the internal profile measurement of encapsulation devices and analyzing the quality evaluation of bonding interface based on semiconductor materials.
机译:本文提出了一种用于三维轮廓测量的红外光干涉系统。该测量系统包括红外卤素光源,林尼克型干涉显微镜,红外InGaAs CCD阵列相机和陶瓷压电。通过传输到GaAs晶片,测得的三维轮廓和微观结构的台阶高度与著名的商用仪器MSA 400通过Stoilov相步进算法获得的结果高度一致。该系统在MEMS领域具有广泛的潜在应用,例如重构封装设备的内部轮廓测量以及分析基于半导体材料的键合界面的质量评估。

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