Refractive index profile measurement appts. of single mode optical waveguides by interferometric near field measurement - contains interference system superimposing images of field distributions, measures phase difference and intensity as function of position

摘要

The arrangement contains an interference system forming images via two optical paths which superimposes the images of the field distributions of two adjacent planes near the end surfaces of the waveguide (1) in an image plane (7). One of the two object planes can lie virtually behind the waveguide end surface. The optical phase difference of the two light distributions and the individual intensity distributions in the image plane are determined as a function of position. ADVANTAGE - The measurement arrangement can perform near field measurements without forming second derivatives.