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Reliability Evaluation of One-Pass and Two-Pass Techniques of Assembly for Package on Packages under Torsion Loads

机译:扭转载荷下包装上包装的单次通过和两次通过技术的可靠性评估

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Package on Packages (PoP) find use in applications that require high performance with increased memory density. One of the greatest benefits of PoP technology is the elimination of the expensive and challenging task of routing high-speed memory lines from under the processor chip out to memory chip in separate packages. Instead, the memory sits on top of the processor and the connections are automatically made during assembly. For this reason PoP technology has gained wide acceptance in cell phones and other mobile applications. PoP technology can be assembled using one-pass and two-pass assembly processes. In the one-pass technique the processor is first mounted to the board, the memory is mounted to the processor and the finished board is then run through the reflow oven in a single pass. The two-pass technique has an intermediate step in which the memory is first mounted onto the processor. Then, these two parts are placed in a carrier tray and reflowed. These joined devices are then mounted on the circuit board and the finished board is reflowed a second time. The two-pass technique has a distinct advantage in that the PoPs can be checked for defects before final assembly using a non-destructive test (such as X-Ray) and hence one would expect higher yield. For this study, identical test vehicles were assembled with eight PoP packages assembled with SAC105 and SAC125 solder for the bottom BGA and top BGA respectively. One-pass technique and two-pass technique were used to assemble two test vehicles each. These test vehicles were evaluated under mechanical torsion loading to establish if method of assembly used has any impact on the mechanical fatigue durability. This was followed by failure analysis to determine failure sites. Time to failure data was plotted as Weibull 2-parameter distributions and ANOVA analysis was performed. No statistically significant difference was found in the reliability of the packages assembled using the two different techniques.
机译:堆叠式封装(PoP)可用于需要高性能和高存储密度的应用程序中。 PoP技术的最大好处之一就是省去了将高速存储线从处理器芯片下方路由到单独封装中的存储芯片这一昂贵且具有挑战性的任务。相反,内存位于处理器的顶部,并且在组装过程中会自动建立连接。因此,PoP技术已在手机和其他移动应用中获得了广泛的接受。 PoP技术可以使用一遍和两遍组装过程进行组装。在单程技术中,首先将处理器安装到板上,然后将内存安装到处理器,然后将成品板单次通过回流焊炉运行。两遍技术具有一个中间步骤,其中首先将内存安装到处理器上。然后,将这两个部分放置在承载托盘中并回流。然后将这些连接的器件安装在电路板上,然后对成品板进行第二次回流。二次通过技术具有明显的优势,因为可以使用无损检测(例如X射线)在最终组装之前检查PoP的缺陷,因此可以期望更高的良率。对于本研究,将相同的测试车用八个PoP封装组装在一起,分别用底部SAGA和顶部BGA的SAC105和SAC125焊料组装。单次通过技术和两次通过技术分别组装了两个测试车辆。在机械扭转载荷下对这些测试车辆进行了评估,以确定所使用的组装方法是否会对机械疲劳耐久性产生任何影响。随后进行故障分析以确定故障位置。失效时间数据绘制为威布尔2参数分布,并进行ANOVA分析。使用两种不同技术组装的包装的可靠性在统计上没有发现显着差异。

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