Floquet modal based analysis of interlaced and overlapped subarrays

摘要

A methodology is presented to analyze interlaced and overlapped (interleaved) subarrays. The analysis is based on eigen vector excitation coupled with Floquet modal expansion of the subarray fields. Numerical results of interlaced and overlapped subarrays using probe-fed patch elements are presented. It is found that interlaced subarrays have superior performances over overlapped and conventional subarrays with and without WAIM layer.