A methodology is presented to analyze overlapped and interlaced (interleaved) subarrays. The analysis is based on eigen vector excitation coupled with Floquet modal expansion of the subarray fields. Numerical results of interlaced and overlapped subarrays using probe-fed patch elements are presented. It is found that for wide angle scan overlapped subarrays have superior performances over interlaced and conventional subarrays with and without wide angle impedance matching layer.
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