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Preliminary research of standard for electrostatic discharge test method for LED chips

机译:LED芯片静电放电测试方法标准的初步研究

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In this paper, the LED chips static characteristics and anti-static technology has been analyzed. Methods for researching anti-static standards of LED chips are proposed that establish a set of test equipment, configuration and procedure in assessing the electrostatic discharge performance of LED chips and even form semiconductor lighting LED chips anti-static testing standards. These four avenues outlined here as conducting internal analysis and description of ESD characteristics of LED chips made of different materials, researching the relationship between LED's ESD performance and the growth process, studying the changes in the thermal resistance, luminous flux as well as in life expectancy of LED chips before ESD and after ESD and establishing typical discharge current waveform, testing range of grades, test equipment configuration, test procedure of LED chips.
机译:本文分析了LED芯片静态特性和防静电技术。提出了研究LED芯片防静电标准的方法,在评估LED芯片的静电放电性能方面建立一组测试设备,配置和程序,甚至形成半导体照明LED芯片防静电测试标准。这四个途径在这里概述为采用不同材料制成的LED芯片的ESD特性的内部分析和描述,研究LED的ESD性能与生长过程之间的关系,研究了热阻,发光通量以及预期寿命的变化在ESD之前和ESD之前的LED芯片和建立典型放电电流波形,等级的测试范围,测试设备配置,LED芯片的测试程序。

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