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A MEMS-Based Infrared Emitter Array for Combat Identification

机译:基于MEMS的红外发射器阵列用于作战识别

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The silicon-based MEMS (MEMS: microelectromechanical systems) Infrared (IR) emitter arrays of 1×2, 2×2 and 3×3 elements are presented. The MEMS infrared emitters were fabricated on silicon-on-insullator (SOI) wafer. The resistively heated poly-silicon membrane fabricated by using deep reactive ion etching (DRIE) process on backside of SOI wafer make a low thermal mass structure, thus this IR-emitter can be modulated at high frequency. A heavily boron doping technology enable the supporting silicon layer to absorb the infrared radiation. As a result, the self-heating effect will reduce the power loss. By using the SOI wafer, the fabrication processes are simplified, and the production costs are decreased. In experiment, the surface temperature distribution of IR emitter arrays were measured by thermal imaging system, and the optical spectrum and modulation characteristics were measured by spectroradiometer. The measured results show that the IR emitter arrays exhibit a strong emission in middle infrared range, and the modulation frequency at 50% modulation depth is about 30Hz. The emitter arrays are expected to improve performance by using suspended membrane and sealed package structure. It is expected that the IR emitter arrays can be used for increasing the visible intensity and distance in the application of infrared Combat Identification.
机译:提出了1×2、2×2和3×3元素的基于硅的MEMS(MEMS:微机电系统)红外(IR)发射器阵列。 MEMS红外发射器是在绝缘体上硅(SOI)晶圆上制造的。通过在SOI晶片背面使用深反应离子刻蚀(DRIE)工艺制造的电阻加热多晶硅膜具有较低的热质量结构,因此可以在高频下调制此IR发射极。重硼掺杂技术使支撑硅层能够吸收红外辐射。结果,自热效应将减少功率损耗。通过使用SOI晶片,简化了制造工艺,并降低了生产成本。在实验中,通过热成像系统测量红外发射器阵列的表面温度分布,并通过分光辐射计测量光谱和调制特性。测量结果表明,红外发射器阵列在中红外范围内发射强,调制深度为50%时的调制频率约为30Hz。期望通过使用悬浮膜和密封包装结构来提高发射器阵列的性能。期望在红外作战识别的应用中,红外发射器阵列可用于增加可见光强度和距离。

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