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The Effect of Ionizing Radiations on the Structural, Electrical and Optical Properties of AIIBVI Polycrystalline Thin Films Used as Solar Cell Materials

机译:电离辐射对用作太阳能电池材料的AIIBVI多晶薄膜的结构,电学和光学性质的影响

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The effects of irradiation with high-energy protons (3 MeV, up to a fluency of 10~13 protons/cm~2), on structural, electrical and optical properties of polycrystalline CdS and CdTe thin films have been investigated. XRD investigation has revealed that the films contain wurtzite-type CdS, (001) preferentially oriented in the growth direction, and cubic phase CdTe, respectively. The defects induced by ionizing radiations have been studied by thermally stimulated current spectroscopy (TSC). Eight kinds of traps were observed in the CdS films and their energies, densities and capture cross sections were quantified.
机译:研究了高能质子(3 MeV,流度达10〜13质子/ cm〜2)对多晶CdS和CdTe薄膜的结构,电学和光学性质的影响。 XRD研究表明,该膜分别包含纤锌矿型CdS,(001)优先沿生长方向取向的立方相CdTe。已经通过热激发电流光谱法(TSC)研究了由电离辐射引起的缺陷。在CdS薄膜中观察到了八种陷阱,并对它们的能量,密度和俘获截面进行了定量。

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