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The anatomy of nanometer timing failures

机译:纳米时序故障的剖析

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Timing failures have been with CMOS ICs forever. Initially, timing failures were comparatively minor, but are now are a plague in many products. This article summarizes the timing properties of the subcircuits that together affect overall timing performance. We then discuss the subtleties of real failures. Test engineers must understand the design issues to deal with IC timing failures.
机译:CMOS IC一直存在时序故障。最初,计时故障相对较小,但现在在许多产品中都困扰着他们。本文总结了子电路的时序特性,这些时序特性共同影响整体时序性能。然后,我们讨论实际失败的精妙之处。测试工程师必须了解设计问题才能处理IC时序故障。

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