首页> 外文会议>Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International >2D QM simulation and optimization of decanano non-overlapped MOS devices
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2D QM simulation and optimization of decanano non-overlapped MOS devices

机译:decanano不重叠MOS器件的2D QM模拟和优化

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摘要

Two-dimensional quantum-mechanical (2D QM) simulations of non-overlapped MOS devices are presented, validated through comparison against experimental data. It is shown that 2D QM simulations are needed to accurately predict the experiments and can thus be used to explore the design trade-offs and optimize the performance. Simulations show that nonoverlapped MOS structures can provide an improvement in switching time up to about 50% with respect to conventional approaches.
机译:提出了非重叠MOS器件的二维量子力学(2D QM)仿真,并通过与实验数据的比较进行了验证。结果表明,需要2D QM仿真才能准确预测实验,因此可用于探索设计折衷方案并优化性能。仿真表明,相对于传统方法,不重叠的MOS结构可以将开关时间缩短多达50%。

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