首页> 外文会议>Electron Devices and Solid-State Circuits, 2003 IEEE Conference on >An highly scalable double density nonvolatile memory cell using two electrically isolated oxide-nitride-oxide charge storage stacks
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An highly scalable double density nonvolatile memory cell using two electrically isolated oxide-nitride-oxide charge storage stacks

机译:使用两个电隔离的氧化物-氮化物-氧化物电荷存储堆栈的高度可扩展的双密度非易失性存储单元

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摘要

A highly scalable double density nonvolatile memory cell using two electrically isolated oxide-nitride-oxide stacks is proposed and demonstrated by numerical device simulation. The operational mechanisms including read, program, erase and inhibit in an array structure are studied in detail. This double storage capability per single cell and highly scalable structure is very suitable for high density NVM application.
机译:提出了一种使用两个电隔离的氧化物-氮化物-氧化物堆叠的高度可扩展的双密度非易失性存储单元,并通过数值设备仿真进行了演示。详细研究了阵列结构中包括读取,编程,擦除和禁止的操作机制。每个单元的这种双存储功能和高度可扩展的结构非常适合于高密度NVM应用。

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