Realize Low-Cost Testing in Analog Signal AC Parameter Test

摘要

Nowadays with the dramatically increasing requirement of consuming IC device in China, it becomes ubiquitous to include analog signal unit in many devices, which makes the analog unit test important and necessary. Currently mixed signal tester has been adapted in most traditional AC parameter test and its test cost is normally high. Since most consuming IC devices are low cost, it will occupy a large percent of the whole device cost if using a mixed signal tester. Thus, more concern is focused on how to find a feasible solution. This paper is concentrated on a certain appropriate way to realize lower cost in analog AC test. We will present some technical details about the low cost application in AC characteristic of video belt region DAC that is one of the above-mentioned test items such as SNR, THD and etc. by applying the application technique to ADC and DAC test optional equipment of the low cost tester. And it explains the effectiveness of this technique.