首页> 外文会议>Optical Microlithography XIV >Characterization Study of an Aqueous Developable Photosensitive Polyimide on 300 mm Wafers
【24h】

Characterization Study of an Aqueous Developable Photosensitive Polyimide on 300 mm Wafers

机译:300 mm晶圆上可水显影的光敏聚酰亚胺的表征研究

获取原文
获取外文期刊封面目录资料

摘要

The advent of 300 mm -wafer processing for semiconductor manufacturing has had a great impact on the development of photolithographic materials, equipment and associated processes. At the same time advanced packaging techniques for these semiconductor devices are making strides for smaller, faster and lower cost parts with improved reliability. Photosensitive polyimides are used for passivation stress buffer relief and soft error protection on almost all memory devices such as DRAM as well as final passivation layers for subsequent interconnect bumping operations on most of today's advanced microprocessors. For processing simplicity and total cost of ownership, it is desirable to use an aqueous developable polyimide to maintain compatibility with standard photoresist processes. This study will investigate the feasibility of processing photosensitive polyimides on 300 mm wafers. The performance of a commercially available, positive acting, aqueous developable polyimide is examined at a thickness appropriate for logic devices. A broadband stepper is utilized since polyimides are highly aromatic polymers that strongly absorb UV light below 350 nm. This stepper exposes photosensitive films using mercury vapor spectrum output from 390 nm to 450 nm (g and h-line) and allows rapid exposure of both broadband as well as narrow spectral sensitive films. The system has been optimized for thick photoresists and polyimides and uses a combination of low numerical aperture with maximum wafer level intensity to achieve well formed images in thick films. Process capability for 300 mm wafers is determined by analyzing polyimide film thickness uniformity and critical dimension (CD) control across the wafer. Basic photoresist characterization techniques such as cross sectional SEM analysis, process linearity and process windows are also used to establish lithographic capabilities. The trade-offs for various process capability windows are reviewed to determine the optimum process conditions for different polyimide applications.
机译:用于半导体制造的300毫米晶圆加工的出现对光刻材料,设备和相关工艺的发展产生了重大影响。同时,用于这些半导体器件的先进封装技术正朝着具有改进的可靠性的更小,更快和成本更低的零件发展。感光聚酰亚胺用于几乎所有存储设备(例如DRAM)以及最终钝化层上的钝化应力缓冲释放和软错误保护,以用于当今大多数高级微处理器上的后续互连碰撞操作。为了简化处理和降低总体拥有成本,希望使用水性可显影聚酰亚胺来保持与标准光刻胶工艺的相容性。这项研究将研究在300毫米晶片上加工光敏聚酰亚胺的可行性。以适合于逻辑器件的厚度检查市售的,正作用的水性可显影聚酰亚胺的性能。由于聚酰亚胺是高度芳族的聚合物,可强烈吸收低于350 nm的紫外线,因此可使用宽带步进器。该步进器使用从390 nm至450 nm(g和h线)输出的汞蒸气光谱对感光膜进行曝光,并可以快速曝光宽带和窄光谱感光膜。该系统已针对厚光刻胶和聚酰亚胺进行了优化,并结合了低数值孔径和最大晶圆级强度的特性,可以在厚膜中获得良好形成的图像。通过分析整个晶圆上的聚酰亚胺薄膜厚度均匀性和临界尺寸(CD)控制,可以确定300 mm晶圆的处理能力。基本的光刻胶表征技术(例如截面SEM分析,工艺线性度和工艺窗口)也用于建立光刻能力。审查了各种工艺能力窗口的权衡,以确定适合不同聚酰亚胺应用的最佳工艺条件。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号