Characterizing Trace Metal impurities in Optical-Waveguid Materials Uisng X-ray Absorption

摘要

X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.