首页> 外国专利> Trace impurity removal from inert or noble gas - using successive packings of metal, esp. calcium, and hydride storage material

Trace impurity removal from inert or noble gas - using successive packings of metal, esp. calcium, and hydride storage material

机译:使用连续填充的金属,特别是从惰性或稀有气体中除去痕量杂质。钙和氢化物储存材料

摘要

Trace impurities are removed from inert or noble gases by passage over (i) a first granular packing of gp. IIa metal or alloy of gp. IIa and IIIa metals to remove a first gp. of impurities; and (ii) a second packing of hydride storage material to remove a second gp. of impurities. USE/ADVANTAGE - Process is used for prodn. of ultra-pure inert or noble gases, esp. N2, for the semiconductor industry. Impurity contents are reduced to max. 0.1 vol. ppm. rapidly, simply and inexpensively.
机译:通过(i)gp的第一个颗粒填料,从惰性或稀有气体中除去痕量杂质。 IIa gp的金属或合金。 IIa和IIIa金属以去除第一gp。杂质(ii)第二包装氢化物存储材料以去除第二gp。杂质。使用/优势-处理用于产品。特别是超纯惰性或稀有气体。 N2,用于半导体工业。杂质含量降至最大。 0.1体积ppm。快速,简单,廉价。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号