The Neugebauer model is a powerful tool in obtaining end-to-end device characterization profiles for halftone color printer calibration. In this paper, we propose total least square (TLS) regression methods to estimate the parameters of Neugebauer models. Compared to the traditional least squares (LS) based methods, the TLS approach is a physically more appropriate procedure, because it accounts for errors in the measured reflectance of both the selected primaries and the modeled reflectance. The proposed TLS techniques are tested on a Xerox color printer with rotated halftone screen, and the results are compared with the LS based algorithms. Our experiments indicate that the TLS methods yield a significant improvement over the LS based techniques for model parameter estimation.
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