首页> 外文会议>Indium Phosphide and Related Materials, 1998 International Conference on >Evaluation of internal efficiency and waveguide loss of 50 nm-period GaInAsP/InP quantum-wire lasers
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Evaluation of internal efficiency and waveguide loss of 50 nm-period GaInAsP/InP quantum-wire lasers

机译:评估50 nm周期GaInAsP / InP量子线激光器的内部效率和波导损耗

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摘要

Internal quantum efficiency /spl eta//sub i/ of GaInAsP/InP 20 nm-wide quantum-wire lasers with a period of 50 nm, fabricated by electron-beam lithography, wet chemical etching and OMVPE embedding growth, was evaluated from the cavity length dependence of the differential quantum efficiency. As the result, high internal quantum efficiency /spl eta//sub i//spl sim/1.0 was obtained at T>200 K, while it decreased with an increase of temperature.
机译:从腔中评估了GaInAsP / InP的GaInAsP / InP 20 nm宽,周期为50 nm的量子线激光器的内部量子效率/ splita // sub i /,周期为50 nm,该电子束光刻,湿法化学蚀刻和OMVPE嵌入生长长度依赖于微分量子效率。结果,在T> 200K时获得了高的内部量子效率/ spleta // sub i // splsim / 1.0,而随着温度的升高而降低。

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