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Anomalous reactivity of InAs-deposited GaAs surfaces

机译:InAs沉积GaAs表面的反常反应性

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We examine the surface reactivity of InAs-covered GaAs[100] surfaces as a function of surface InAs coverage using trimethylgallium (TMG) as a probe molecule, which is a typical source material for the epitaxial growth methods of compound semiconductors. We find an anomalous behaviour of the dependence of TMG decomposition rate; the surface decomposition rate is not determined simply by the fraction of the surface covering elements. TMG decomposition rate on the InAs-covered GaAs [100] surface is constant and close to that on the clean GaAs surfaces as far as the two-dimensional growth is maintained, even when the surface is fully covered with InAs. The results are discussed on the basis of the surface structure.
机译:我们使用三甲基镓(TMG)作为探针分子检查了InAs覆盖的GaAs [100]表面的表面反应性,作为表面InAs覆盖率的函数,这是化合物半导体外延生长方法的典型来源。我们发现TMG分解速率的依赖性是异常的。表面分解速率不是简单地由表面覆盖元素的比例决定的。只要保持二维生长,即使覆盖InAs的GaAs [100]表面上的TMG分解速率是恒定的,也接近于干净的GaAs表面上的TMG分解速率。在表面结构的基础上讨论了结果。

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