首页> 外文会议>Indium Phosphide and Related Materials, 1997., International Conference on >Observation of spinodal phase separation and quantum dot formation in InGaAs/GaAs layers grown at down-ramped growth temperatures
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Observation of spinodal phase separation and quantum dot formation in InGaAs/GaAs layers grown at down-ramped growth temperatures

机译:在下降的生长温度下生长的InGaAs / GaAs层中旋节线相分离和量子点形成的观察

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We observed spinodal phase separation in In/sub x/Ga/sub 1-x/As layers grown on GaAs substrates at decreasing growth temperatures. The phase separation results in quantum-wire like structures for high In content (x=0.2) and low rates of temperature decrease (0.1/spl deg/C/s). With faster rates of temperature decrease (0.3/spl deg/C/s) and a decreased In content (x/spl ap/0.03) formation of island-like structures is observed. The islands show photoluminescence emission of high intensity and comparatively narrow linewidth (/spl ap/30 meV). Calorimetric absorption spectroscopy (CAS) was carried out at T=500 mK, where particularly high sensitivity is realised, in order to confirm confinement of carriers in these structures.
机译:我们观察到在降低的生长温度下,在GaAs衬底上生长的In / sub x / Ga / sub 1-x / As层中的旋节线相分离。相分离导致高In含量(x = 0.2)和低温度降低速率(0.1 / spl deg / C / s)的量子线状结构。随着温度降低速率的加快(0.3 / spl deg / C / s)和In含量的降低(x / spl ap / 0.03),观察到了岛状结构的形成。这些岛显示出高强度和相对窄的线宽(/ spl ap / 30 meV)的光致发光发射。量热吸收光谱法(CAS)是在T = 500 mK时进行的,其中实现了特别高的灵敏度,以确认载流子在这些结构中的局限性。

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