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Electro magnetic simulation and measurement of electrical parasitics in high density QFP packages

机译:高密度QFP封装中的电磁仿真和电气寄生效应的测量

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The signal distortion caused by the RLC parasitics associated with IC packages has become a factor of concern. This paper describes the application of three dimensional field solving software to model and extract parasitics associated with the wire bonds and package leads of a PQFP package. The simulated results are compared with the frequency domain measurement results and are found to be in good agreement. The Vector Network Analyser (VNA) based S-parameter measurement technique is used to obtain package inductance and capacitance. The measurement methodology and test set-up are presented in this paper. The package electrical parameters are determined per unit interconnect length.
机译:由与IC封装相关的RLC寄生效应引起的信号失真已成为人们关注的一个因素。本文介绍了三维场求解软件在建模和提取与PQFP封装的引线键合和封装引线相关的寄生效应中的应用。将仿真结果与频域测量结果进行比较,发现结果吻合良好。基于矢量网络分析仪(VNA)的S参数测量技术用于获得封装电感和电容。本文介绍了测量方法和测试设置。封装电气参数是根据单位互连长度确定的。

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