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Methods of testing light-emitting elements and devices for middle- and far-IR spectral regions based on negative luminescence phenomena

机译:基于负发光现象的中,远红外光谱区域的发光元件和器件的测试方法

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Abstract: The complex method for determination of the important parameters of narrow-gap semiconductors and devices on their base at room and higher temperatures from the analysis of field and temperature dependences of the negative luminescence phenomenon has been developed. The study of the lifetime, surface recombination velocity and composition of narrow-gap epitaxial Hg$-1$MIN@x$/Cd$-x$/Te films has been reported. !4
机译:摘要:通过分析负发光现象的场和温度相关性,开发了一种在室温和高温下确定窄间隙半导体和器件的重要参数的复杂方法。已经报道了对窄间隙外延Hg $ -1 $ MIN @ x $ / Cd $ -x $ / Te薄膜的寿命,表面复合速度和组成的研究。 !4

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