首页> 外文会议>Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on >Novel current-blocking laser structures using directly-bonded InP-SiO/sub 2/-InP
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Novel current-blocking laser structures using directly-bonded InP-SiO/sub 2/-InP

机译:使用直接键合InP-SiO / sub 2 / -InP的新型电流阻挡激光器结构

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We propose a novel laser structure which uses a SiO/sub 2/ insulator sandwiched with InP as a current blocking layer. The structure has been successfully fabricated by directly bonding InP to SiO/sub 2/. A threshold current density of 1.9 kA/cm/sup 2/ acid a maximum output power of 60 mW have been achieved for a 1.3-/spl mu/m InGaAsP laser with a bulk active layer and a 300-/spl mu/m cavity. This result implies that the leakage current is negligible. The parasitic capacitance has been measured to be 31 pF even for a laser with an area of 300 /spl mu/m/spl times/300 /spl mu/m.
机译:我们提出了一种新颖的激光器结构,该结构使用夹有InP的SiO / sub 2 /绝缘体作为电流阻挡层。通过将InP直接键合到SiO / sub 2 /已经成功地制造了该结构。对于具有块状有源层和300- / splμm/ m腔的1.3- / splμm/ m InGaAsP激光器,已经实现了1.9 kA / cm / sup 2 /酸的阈值电流密度/ 60 mW的最大输出功率。 。该结果表明泄漏电流可以忽略不计。即使对于面积为300 / spl mu / m / spl乘以/ 300 / spl mu / m的激光器,寄生电容也被测量为31 pF。

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