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FUTURE TECHNOLOGY CHALLENGE FOR GIGA BIT DRAM GENERATION

机译:千兆比特DRAM产生的未来技术挑战

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Within the near future, breakthrough for new materials and technologies is essential to overcome the barriers. In lithography, new light source for optical or non optical system (E-beam, X-ray) should be introduced. Requirements of high e material for capacitor, CVD Cu plus low e material for interconnection, CMP for planarization, are becoming more stringent as a result of device scaling down. ULSI technology will reach the sub-quarter micron range before the end of this century. Since the semiconductor industry will face with many problems, as mentioned above, it is necessary to make major efforts to overcome the barriers by C & C (Competition & Cooperation).
机译:在不久的将来,新材料和新技术的突破对于克服这些障碍至关重要。在光刻中,应引入用于光学或非光学系统(电子束,X射线)的新光源。由于器件尺寸的缩小,对电容器的高e材料,CVD铜,互连的低e材料,平面化CMP的要求越来越严格。在本世纪末之前,ULSI技术将达到四分之一微米的范围。如上所述,由于半导体工业将面临许多问题,因此有必要做出重大努力来克服C&C(竞争与合作)的壁垒。

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