首页> 外文会议>Electronic Components and Technology Conference, 1992. Proceedings., 42nd >Characterization and reliability of electrolytic capacitors exposed to halogenated solvents
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Characterization and reliability of electrolytic capacitors exposed to halogenated solvents

机译:暴露于卤化溶剂的电解电容器的特性和可靠性

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To determine the effect of exposure to halogenated solvents on electrolytic-capacitor lifetime, populations of these capacitors were exposed to accelerated testing. It is shown that halogenated solvents cause electrolytic capacitors to fail open at the anode. The electrolytic corrosion, which dissolves the passivating oxide layer on the anodically biased aluminum and exposes a clean aluminum surface, is the rate limiting step in the failures. Halogenated solvents then readily react with the aluminum surface and erode the electrode until the solvent is consumed. The increase in pressure inside the capacitor can cause the capacitor to vent, further accelerating failure. Accelerated life testing of one of the capacitor types considered suggests that it may fail at normal operating conditions in 2-3 years. Monitoring of capacitor characteristics during the accelerated life test shows that changes in these characteristic parameters cannot be used to predict failure.
机译:为了确定暴露在卤化溶剂中对电解电容器寿命的影响,对这些电容器进行了加速测试。结果表明,卤化溶剂会导致电解电容器在阳极开路失败。电解腐蚀是破坏过程中的限速步骤,电解腐蚀将阳极偏压的铝上的钝化氧化物层溶解并暴露出干净的铝表面。然后,卤化的溶剂容易与铝表面反应并腐蚀电极,直到溶剂被消耗掉。电容器内部压力的增加会导致电容器泄放,从而进一步加速故障。对所考虑的其中一种电容器进行的加速寿命测试表明,它可能会在2-3年的正常工作条件下失效。在加速寿命测试过程中对电容器特性的监控表明,这些特性参数的变化不能用于预测故障。

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